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smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-21-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-21-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint F3
Device Model: SAMSUNG HD103SJ
Serial Number: S246J9BB127982
LU WWN Device Id: 5 0024e9 20455ca2f
Firmware Version: 1AJ10001
User Capacity: 1 000 204 886 016 bytes [1,00 TB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Tue May 17 15:31:08 2016 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 9300) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 155) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 276
2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0
3 Spin_Up_Time 0x0023 071 069 025 Pre-fail Always - 8856
4 Start_Stop_Count 0x0032 097 097 000 Old_age Always - 3922
5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 21092
10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 4010
191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 189
192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
194 Temperature_Celsius 0x0002 064 042 000 Old_age Always - 33 (Min/Max 13/58)
195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 001 001 000 Old_age Always - 59870
200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 2533
223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0
225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 4286
SMART Error Log Version: 1
ATA Error Count: 34 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 34 occurred at disk power-on lifetime: 21091 hours (878 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 10 00 1d 00 e0 Error: ICRC, ABRT at LBA = 0x00001d00 = 7424
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 10 00 1d 8f ec 08 00:00:00.212 WRITE DMA
ca 00 08 88 fd 8d ec 08 00:00:00.212 WRITE DMA
ca 00 08 b0 a6 8b ec 08 00:00:00.212 WRITE DMA
ca 00 08 00 01 89 ec 08 00:00:00.212 WRITE DMA
ca 00 08 a0 15 86 ec 08 00:00:00.212 WRITE DMA
Error 33 occurred at disk power-on lifetime: 21091 hours (878 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 18 00 ac 00 e0 Error: ICRC, ABRT at LBA = 0x0000ac00 = 44032
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 58 c0 ac a9 e9 08 00:00:00.206 WRITE DMA
ca 00 58 c0 ab a8 e9 08 00:00:00.206 WRITE DMA
ca 00 58 00 64 a4 e9 08 00:00:00.206 WRITE DMA
ca 00 58 98 8f a0 e9 08 00:00:00.206 WRITE DMA
ca 00 08 f8 ff 9c e9 08 00:00:00.206 WRITE DMA
Error 32 occurred at disk power-on lifetime: 21091 hours (878 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 20 00 54 00 e0 Error: ICRC, ABRT at LBA = 0x00005400 = 21504
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 f8 28 54 d6 e8 08 00:00:00.205 WRITE DMA
ca 00 e0 c8 10 d2 e8 08 00:00:00.205 WRITE DMA
35 00 00 88 09 d1 e0 08 00:00:00.205 WRITE DMA EXT
ca 00 60 e8 b7 cd e8 08 00:00:00.205 WRITE DMA
ca 00 18 00 54 ca e8 08 00:00:00.205 WRITE DMA
Error 31 occurred at disk power-on lifetime: 21091 hours (878 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 00 00 a0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ec 00 00 01 00 00 a0 00 00:00:00.008 IDENTIFY DEVICE
ec 00 01 01 00 00 a0 00 00:00:00.007 IDENTIFY DEVICE
00 00 00 00 00 00 00 00 00:00:00.006 NOP [Abort queued commands]
Error 30 occurred at disk power-on lifetime: 21091 hours (878 days + 19 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 00 00 00 a0
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ec 00 01 01 00 00 a0 00 00:00:00.007 IDENTIFY DEVICE
00 00 00 00 00 00 00 00 00:00:00.006 NOP [Abort queued commands]
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Completed [00% left] (0-65535)
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay. |
Всего записей: 47 | Зарегистр. 22-12-2010 | Отправлено: 18:37 17-05-2016 | Исправлено: bckpkol, 19:41 17-05-2016 |
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