Conner
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Коллеги, решил попробовать силы в борьбе с mSATA TOSHIBA THNSNS128GMCP, контроллер TC58NC5HJ8GSB-01 память 4хTH58TEG8DBHBASC, в системе определяется как SandForce***
Прошиваю 27030, 27118, 27278, 27289 – одна и та же ошибка
-----------------------------------------------------------------------------
Flash Test Parameters:
-----------------------------------------------------------------------------
Block Count: 0
Page Count: 1
Bus Count: 2
Chip Enabled Count: 2
Die Count: 1
Lane Count: 4
Plane Count: 2
-----------------------------------------------------------------------------
Results Notes:
-----------------------
N1 - At least one page tested and passed with no bit errors.
N2 - No test data available. Test may have aborted, or failed during the testing.
N3 - At least one page tested and had errors less than or equal to half the range of ECC correction power.
N4 - At least one erased page tested had bit error rate greater than half the correction power.
N5 - Walking zeros test failed.
N6 - Walking ones test failed.
N7 - Block contained factory bad block markings and testing was skipped.
N8 - At least one page tested and had bit error rate greater than the correction power on plane 0.
N9 - Block in plane 0 was marked as a factory bad block.
N10 - At least one page tested and had bit error rate greater than the correction power on plane 1.
N11 - Block in plane 1 was marked as a factory bad block.
-----------------------------------------------------------------------------
+------+------+------+------+--------+--------------------------------------------+---------+
| Bus | CE | Die | Lane | Value | Result Notes | Overall |
+------+------+------+------+--------+--------------------------------------------+---------+
| 0 | 0 | 0 | 0 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 0 | 0 | 0 | 1 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 0 | 0 | 0 | 2 | 0x0374 | N4,N5,N6,N8,N10 | FAIL |
+------+------+------+------+--------+--------------------------------------------+---------+
| 0 | 0 | 0 | 3 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 0 | 1 | 0 | 0 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 0 | 1 | 0 | 1 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 0 | 1 | 0 | 2 | 0x0374 | N4,N5,N6,N8,N10 | FAIL |
+------+------+------+------+--------+--------------------------------------------+---------+
| 0 | 1 | 0 | 3 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 1 | 0 | 0 | 0 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 1 | 0 | 0 | 1 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 1 | 0 | 0 | 2 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 1 | 0 | 0 | 3 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 1 | 1 | 0 | 0 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 1 | 1 | 0 | 1 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 1 | 1 | 0 | 2 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
| 1 | 1 | 0 | 3 | 0x0001 | N1 | PASS |
+------+------+------+------+--------+--------------------------------------------+---------+
-----------------------------------------------------------------------------
Total Number of test results: 16
Number of failures: 2
Number of Passed with warnings: 0
No. Passed without warnings: 14
-----------------------------------------------------------------------------
#
Пробую без Flash Test – ругается на FlashID
#
[Thu 07/06/2017 16:04:56] - FATAL_ERROR: Could not perform the FORMAT() operation on the drive... (0x0000C040:SF_SCT (C040h): Flash memory ID not match in Format command)
[Thu 07/06/2017 16:04:56] - End of Genesis manufacturing log.
[Thu 07/06/2017 16:04:56] - Exiting...
[Thu 07/06/2017 16:04:56] - Overall Result for Device: /dev/sg0 ****** FAIL ******
READ_FLASH_ID выдает следующее:
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
argv[1]: -READ_FLASH_ID
argv[2]: 4:0:0:0
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
[Sun 07/09/2017 15:16:45] - Instructing the operating system to purge any existing cached data for device: '4:0:0:0'
[Sun 07/09/2017 15:16:50] - Issuing a discovery command for device: '4:0:0:0'
[Sun 07/09/2017 15:16:55] - Discovery command completed...
[Sun 07/09/2017 15:16:55] - Waiting 5 seconds for the system to settle...
[Sun 07/09/2017 15:17:00] - Device designation string '4:0:0:0' is mapped to node '/dev/sg0'
[Sun 07/09/2017 15:17:03] - 16 Flash IDs
[Sun 07/09/2017 15:17:03] - Bus Count: 2
[Sun 07/09/2017 15:17:03] - Chip Enable Count: 2
[Sun 07/09/2017 15:17:03] - Lane Count: 4
[Sun 07/09/2017 15:17:03] -
[Sun 07/09/2017 15:17:03] - Bus Chip Enable Lane Flash ID
[Sun 07/09/2017 15:17:03] - ------------------------------------------------
[Sun 07/09/2017 15:17:03] - 0 0 0 00 00 00 00 00 00 00 00
[Sun 07/09/2017 15:17:03] - 0 0 1 00 00 00 00 00 00 00 00
[Sun 07/09/2017 15:17:03] - 0 0 2 00 00 00 00 00 00 00 00
[Sun 07/09/2017 15:17:03] - 0 0 3 00 00 00 00 00 00 00 00
[Sun 07/09/2017 15:17:03] - 0 1 0 00 00 00 00 00 00 00 00
[Sun 07/09/2017 15:17:03] - 0 1 1 00 00 00 00 00 00 00 00
[Sun 07/09/2017 15:17:03] - 0 1 2 00 00 00 00 00 00 00 00
[Sun 07/09/2017 15:17:03] - 0 1 3 00 00 00 00 00 00 00 00
[Sun 07/09/2017 15:17:03] - 1 0 0 98 DE 94 83 76 D6 0C 00
[Sun 07/09/2017 15:17:03] - 1 0 1 98 DE 94 83 76 D6 0C 00
[Sun 07/09/2017 15:17:03] - 1 0 2 98 DE 94 83 76 D6 0C 00
[Sun 07/09/2017 15:17:03] - 1 0 3 98 DE 94 83 76 D6 0C 00
[Sun 07/09/2017 15:17:03] - 1 1 0 98 DE 94 83 76 D6 0C 00
[Sun 07/09/2017 15:17:03] - 1 1 1 98 DE 94 83 76 D6 0C 00
[Sun 07/09/2017 15:17:03] - 1 1 2 98 DE 94 83 76 D6 0C 00
[Sun 07/09/2017 15:17:03] - 1 1 3 98 DE 94 83 76 D6 0C 00
[Sun 07/09/2017 15:17:03] - ------------------------------------------------
[Sun 07/09/2017 15:17:03] - Successfully completed Read Flash ID operation.
[Sun 07/09/2017 15:17:03] - End of Genesis manufacturing log.
[Sun 07/09/2017 15:17:03] - Exiting...
[Sun 07/09/2017 15:17:03] - Overall Result for Device: ****** PASS ******
Видно, что действительно не везде ExpectedMemoryID равен 0xDE98.
Какой можно сделать вывод? Один из чипов памяти отправился на покой? И один ли? Или я не прав?
Что можно еще сделать? Подключиться терминалом, и копнуть глубже, я так понял в нем некуда( |
